Authors:
Bernacki, S
Hunt, K
Tyson, S
Hudgens, S
Pashmakov, B
Czubatyj, W
Citation: S. Bernacki et al., Total dose radiation response and high temperature imprint characteristicsof chalcogenide based RAM resistor elements, IEEE NUCL S, 47(6), 2000, pp. 2528-2533