Authors: CIEPLAK MZ BERKOWSKI M GUHA S CHENG E VAGELOS AS RABINOWITZ DJ WU B TROFIMOV IE LINDENFELD P

Citation: Mz. Cieplak et al., THICKNESS DEPENDENCE OF LA2-XSRXCUO4 FILMS, Applied physics letters, 65(26), 1994, pp. 3383-3385