Authors:
SHARDA T
VAIDYA A
MISRA DS
BHARGAVA S
BIST HD
VELUCHAMY P
MINOURA H
SELVAM P
Citation: T. Sharda et al., STOICHIOMETRY OF THE DIAMOND SILICON INTERFACE AND ITS INFLUENCE ON THE SILICON CONTENT OF DIAMOND FILMS/, Journal of applied physics, 83(2), 1998, pp. 1120-1124
Authors:
JOSEPH T
VENKATARAMAN V
NAGARANI A
DAVID J
BHATT A
VAIDYA A
Citation: T. Joseph et al., SAFETY PHARMACOLOGY OF A COMBINATION OF TINIDAZOLE AND OXYPHENONIUM BROMIDE, Arzneimittel-Forschung, 47(7), 1997, pp. 869-872
Citation: H. Boschifilho et al., SCHWINGERS METHOD FOR THE ELECTRON PROPAGATOR IN A PLANE-WAVE FIELD REVISITED, Physics letters. A, 215(3-4), 1996, pp. 109-112