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Results: 24

Authors: DEBIEVRE P VALKIERS S TAYLOR PDP
Citation: P. Debievre et al., THE IMPORTANCE OF THE AVOGADRO CONSTANT FOR AMOUNT-OF-SUBSTANCE MEASUREMENTS, Fresenius' journal of analytical chemistry, 361(3), 1998, pp. 227-234

Authors: VALKIERS S AREGBE Y TAYLOR PDP DEBIEVRE P
Citation: S. Valkiers et al., A PRIMARY XENON ISOTOPIC GAS STANDARD WITH SI TRACEABLE VALUES FOR ISOTOPIC COMPOSITION AND MOLAR-MASS, International journal of mass spectrometry and ion processes, 173(1-2), 1998, pp. 55-63

Authors: AREGBE Y VALKIERS S MAYER K DEBIEVRE P WESSEL RM ALINK A
Citation: Y. Aregbe et al., MEASURING AMOUNT RATIOS OF GAS ISOTOPES BY 2 PRIMARY METHODS, Metrologia, 35(1), 1998, pp. 7-16

Authors: TAYLOR PDP LEHTO S VALKIERS S DEBIEVRE P SELGRAD O FLEGEL U KRUCK T
Citation: Pdp. Taylor et al., MICROSCALE SYNTHESIS OF FE(PF3)(5) FOR GAS-SOURCE MASS-SPECTROMETRY, Analytical chemistry, 70(5), 1998, pp. 1033-1035

Authors: AREGBE Y MAYER K VALKIERS S DEBIEVRE P
Citation: Y. Aregbe et al., DETECTION OF REPROCESSING ACTIVITIES THROUGH STABLE-ISOTOPE MEASUREMENTS OF ATMOSPHERIC NOBLE-GASES, Fresenius' journal of analytical chemistry, 358(4), 1997, pp. 533-535

Authors: GONFIANTINI R VALKIERS S TAYLOR PDP DEBIEVRE P
Citation: R. Gonfiantini et al., ADSORPTION IN GAS MASS-SPECTROMETRY-II - EFFECTS ON THE MEASUREMENT OF ISOTOPE AMOUNT RATIOS, International journal of mass spectrometry and ion processes, 171(1-3), 1997, pp. 231-242

Authors: GONFIANTINI R VALKIERS S TAYLOR PDP DEBIEVRE P
Citation: R. Gonfiantini et al., ADSORPTION IN GAS MASS-SPECTROMETRY .1. EFFECTS ON THE MEASUREMENT OFINDIVIDUAL ISOTOPIC-SPECIES, International journal of mass spectrometry and ion processes, 163(3), 1997, pp. 207-219

Authors: GONFIANTINI R VALKIERS S TAYLOR PDP DEBIEVRE P
Citation: R. Gonfiantini et al., USING ISOTOPIC DISEQUILIBRIUM OF CO2 TO MODEL GAS-ADSORPTION IN MASS-SPECTROMETRIC MEASUREMENTS, International journal of mass spectrometry and ion processes, 161(1-3), 1997, pp. 15-26

Authors: GONFIANTINI R DEBIEVRE P VALKIERS S TAYLOR PDP
Citation: R. Gonfiantini et al., MEASURING THE MOLAR-MASS OF SILICON FOR A BETTER AVOGADRO CONSTANT - REDUCED UNCERTAINTY, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 566-571

Authors: DEBIEVRE P VALKIERS S GONFIANTINI R TAYLOR PDP BETTIN H SPIEWECK F PEUTO A PETTORRUSO S MOSCA M FUJII K TANAKA M NEZU Y LEISTNER AJ GIARDINI WJ
Citation: P. Debievre et al., THE MOLAR VOLUME OF SILICON, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 592-595

Authors: AREGBE Y MAYER K VALKIERS S DEBIEVRE P
Citation: Y. Aregbe et al., RELEASE OF ANTHROPOGENIC XENON TO THE ATMOSPHERE - A LARGE-SCALE ISOTOPE-DILUTION, International journal of mass spectrometry and ion processes, 154(1-2), 1996, pp. 89-97

Authors: AREGBE Y VALKIERS S MAYER K DEBIEVRE P
Citation: Y. Aregbe et al., COMPARATIVE ISOTOPIC MEASUREMENTS ON XENON AND KRYPTON, International journal of mass spectrometry and ion processes, 153(1), 1996, pp. 1-5

Authors: DEBIEVRE P VALKIERS S PEISER HS TAYLOR PDP HANSEN P
Citation: P. Debievre et al., MASS-SPECTROMETRIC METHODS FOR DETERMINING ISOTOPIC COMPOSITION AND MOLAR-MASS TRACEABLE TO THE SI, EXEMPLIFIED BY IMPROVED VALUES FOR NITROGEN, Metrologia, 33(5), 1996, pp. 447-455

Authors: DEBIEVRE P LENAERS G MURPHY TJ PEISER HS VALKIERS S
Citation: P. Debievre et al., THE CHEMICAL PREPARATION AND CHARACTERIZATION OF SPECIMENS FOR ABSOLUTE MEASUREMENTS OF THE MOLAR-MASS OF AN ELEMENT, EXEMPLIFIED BY SILICON, FOR REDETERMINATIONS OF THE AVOGADRO CONSTANT, Metrologia, 32(2), 1995, pp. 103-110

Authors: BECKER P BETTIN H DEBIEVRE P HOLM C KUTGENS U SPIEWECK F STUMPEL J VALKIERS S ZULEHNER W
Citation: P. Becker et al., THE SI-28 PATH TO THE AVOGADRO CONSTANT - FIRST EXPERIMENTS AND OUTLOOK, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 522-525

Authors: DEBIEVRE P VALKIERS S PEISER S BECKER P LUDICKE F SPIEWECK F STUMPEL J
Citation: P. Debievre et al., A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 530-532

Authors: BASILE G BECKER P BERGAMIN A BETTIN H CAVAGNERO G DEBIEVRE P KUTGENS U MANA G MOSCA M PAJOT B PANCIERA R PASIN W PETTORRUSO S PEUTO A SACCONI A STUMPEL J VALKIERS S VITTONE E ZOSI G
Citation: G. Basile et al., A NEW DETERMINATION OF N-A, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 538-541

Authors: DEBIEVRE P VALKIERS S PESIER HS
Citation: P. Debievre et al., NEW VALUES FOR SILICON REFERENCE MATERIALS, CERTIFIED FOR ISOTOPE ABUNDANCE RATIOS, Journal of research of the National Institute of Standards and Technology, 99(2), 1994, pp. 201-202

Authors: TAYLOR PDP VALKIERS S VENDELBO D DEBIEVRE P
Citation: Pdp. Taylor et al., DETERMINATION OF THE ISOTOPIC COMPOSITION AND ATOMIC-WEIGHT OF TUNGSTEN USING GAS-SOURCE MASS-SPECTROMETRY - OPENING THE ROUTE TO THE ESTABLISHMENT OF THE TRACEABILITY OF TUNGSTEN AMOUNT MEASUREMENTS TO THE SISYSTEM, International journal of mass spectrometry and ion processes, 134(2-3), 1994, pp. 120000007-120000010

Authors: SCHAEFER F TAYLOR PDP VALKIERS S DEBIEVRE P
Citation: F. Schaefer et al., COMPUTATIONAL PROCEDURES FOR THE TREATMENT OF MEASURED OR PUBLISHED ISOTOPE ABUNDANCE DATA, International journal of mass spectrometry and ion processes, 133(1), 1994, pp. 65-71

Authors: DEBIEVRE P VALKIERS S SCHAEFER F PEISER HS SEYFRIED P
Citation: P. Debievre et al., HIGH-ACCURACY ISOTOPE ABUNDANCE MEASUREMENTS FOR METROLOGY, PTB-Mitteilungen, 104(4), 1994, pp. 225-236

Authors: DEBIEVRE P VALKIERS S
Citation: P. Debievre et S. Valkiers, MOLAR-MASS DETERMINATIONS FOR N-A (AVOGADRO) PROJECTS - PRESENT STATUS AND POTENTIAL FOR THE FUTURE, Metrologia, 31(3), 1994, pp. 245-249

Authors: KU H SCHAEFER F VALKIERS S DEBIEVRE P
Citation: H. Ku et al., A 3-RATIO SCHEME FOR THE MEASUREMENT OF ISOTOPIC-RATIOS OF SILICON, Journal of research of the National Institute of Standards and Technology, 98(2), 1993, pp. 225-229

Authors: TAYLOR PDP VALKIERS S DEBIEVRE P FLEGEL U KRUCK T
Citation: Pdp. Taylor et al., STABLE-ISOTOPE ANALYSIS OF IRON BY GAS-PHASE ELECTRON-IMPACT MASS-SPECTROMETRY, Analytical chemistry, 65(21), 1993, pp. 3166-3167
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