P. Debievre et al., NEW VALUES FOR SILICON REFERENCE MATERIALS, CERTIFIED FOR ISOTOPE ABUNDANCE RATIOS, Journal of research of the National Institute of Standards and Technology, 99(2), 1994, pp. 201-202
New isotope abundance and relative atomic mass (atomic weight) values-
with low, hitherto unattained uncertainty-are reported for two previou
sly described silicon reference materials using a well-known method wi
th an improved isotope-ratio mass spectrometer. These new values are d
irectly traceable to the SI, more specifically to the unit for amount
of substance, the mole, and independent of the SI unit of mass and of
the Avogadro constant. Besides the residual mass-spectrometric uncerta
inties, these new values depend in effect only on a recently published
direct comparison of the cyclotron frequency in a Penning trap of Si-
28+ with that of C-12+.