Authors: VANDERHOOGENHOF WW DEBOER DKG

Citation: Ww. Vanderhoogenhof et Dkg. Deboer, GLANCING INCIDENCE X-RAY-ANALYSIS - FORGOTTEN OR TO BE DISCOVERED, Surface and interface analysis, 22(1-12), 1994, pp. 572-575

Authors: SCHILLER C MARTIN GM VANDERHOOGENHOF WW CORNO J

Citation: C. Schiller et al., FAST AND ACCURATE ASSESSMENT OF NANOMETER LAYERS USING GRAZING X-RAY REFLECTOMETRY, Philips journal of research, 47(3-5), 1993, pp. 217-234