Authors:
VANKEMPEN H
BOON EJG
VANDERWIELEN MCMM
WILDOER JWG
PRINS MWJ
JANSEN R
SCHAD R
Citation: H. Vankempen et al., APPLICATIONS OF SCANNING-TUNNELING-MICROSCOPY TO SOLID-STATE PHYSICS, Acta Physica Polonica. A, 93(2), 1998, pp. 323-331
Authors:
VANDERWIELEN MCMM
VANROIJ AJA
VANKEMPEN H
Citation: Mcmm. Vanderwielen et al., DIRECT OBSERVATION OF FRIEDEL OSCILLATIONS AROUND INCORPORATED SIE, DOPANTS IN GAAS BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY, Physical review letters, 76(7), 1996, pp. 1075-1078
Authors:
JANSEN R
VANDERWIELEN MCMM
PRINS MWJ
ABRAHAM DL
VANKEMPEN H
Citation: R. Jansen et al., PROGRESS TOWARD SPIN-SENSITIVE SCANNING-TUNNELING-MICROSCOPY USING OPTICAL ORIENTATION IN GAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2133-2135
Authors:
PRINS MWJ
VANDERWIELEN MCMM
ABRAHAM DL
VANKEMPEN H
VANKESTEREN HW
Citation: Mwj. Prins et al., MAGNETOOPTICAL FARADAY-EFFECT PROBED IN A SCANNING TUNNELING MICROSCOPE, IEEE transactions on magnetics, 30(6), 1994, pp. 4491-4493