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Authors: CASTALDINI A CAVALLINI A EVANS JH HAWKINS ID PEAKER AR VANDINI M

Citation: A. Castaldini et al., OPTICAL CHARACTERIZATION OF DEEP STATES ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN SILICON, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 170-174