Citation: R. Bellens et al., BUILDING-IN RELIABILITY DURING LIBRARY DEVELOPMENT - HOT-CARRIER DEGRADATION IS NO LONGER A PROBLEM OF THE TECHNOLOGISTS ONLY, Microelectronics and reliability, 37(10-11), 1997, pp. 1425-1428
Citation: R. Vancamp et al., RELIABILITY OF A FOCUSED ION-BEAM REPAIR ON DIGITAL CMOS CIRCUITS, Microelectronics and reliability, 36(11-12), 1996, pp. 1787-1790
Authors:
VERBEKE J
VANDEWEGE J
VANDOORSELAER K
VETTER P
DEPESTEL G
Citation: J. Verbeke et al., STABILITY IMPROVEMENT OF AN OPTICAL RECEIVER MAKING USE OF A FOCUSED ION-BEAM APPARATUS, Electronics Letters, 31(5), 1995, pp. 388-390