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Results:
1-7
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Results: 7
Authors:
BONFIGLIO A
CASU MB
VANZI M
DEPALO R
MAGISTRALI F
SALMINI G
Citation: A. Bonfiglio et al., EARLY SIGNATURES FOR REDR-BASED LASER DEGRADATIONS, Microelectronics and reliability, 38(6-8), 1998, pp. 1215-1220
Authors:
BONFIGLIO A
CASU MB
MAGISTRALI F
MAINI M
SALMINI G
VANZI M
Citation: A. Bonfiglio et al., A DIFFERENT APPROACH TO THE ANALYSIS OF DATA IN LIFE-TESTS OF LASER-DIODES, Microelectronics and reliability, 38(5), 1998, pp. 767-771
Authors:
MENEGHESSO G
MAGISTRALI F
SALA D
VANZI M
CANALI C
ZANONI E
Citation: G. Meneghesso et al., FAILURE MECHANISMS DUE TO METALLURGICAL INTERACTIONS IN COMMERCIALLY AVAILABLE ALGAAS GAAS AND ALGAAS/INGAAS HEMTS/, Microelectronics and reliability, 38(4), 1998, pp. 497-506
Authors:
CIAPPA M
NAITANA A
VANZI M
Citation: M. Ciappa et al., TRANSIENT STRESSING AND CHARACTERIZATION OF THIN TUNNEL OXIDES, Microelectronics and reliability, 37(10-11), 1997, pp. 1525-1528
Authors:
DEMUNARI I
VANZI M
SCORZONI A
FANTINI F
Citation: I. Demunari et al., ON THE ASTM ELECTROMIGRATION TEST STRUCTURE APPLIED TO AL-1-PERCENT-SI TIN/TI BAMBOO METAL LINES/, Quality and reliability engineering international, 11(1), 1995, pp. 33-39
Authors:
BACCHETTA N
BISELLO D
CANDELORI A
PACCAGNELLA A
SPADA M
VANZI M
Citation: N. Bacchetta et al., SPICE ANALYSIS OF SIGNAL PROPAGATION IN SI MICROSTRIP DETECTORS, IEEE transactions on nuclear science, 42(4), 1995, pp. 459-466
Authors:
RINALDI D
SANTINI S
VANZI M
Citation: D. Rinaldi et al., ELECTRON-TUNNELING FROM ROUGH SURFACES - AN APPLICATION TO TPFG EEPROM CELLS, Semiconductor science and technology, 9(7), 1994, pp. 1414-1425
Risultati:
1-7
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