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Results: 1-7 |
Results: 7

Authors: FEDORTSOV AB LETENKO DG CHURKIN YV TSENTSIPER LM VEDDE J
Citation: Ab. Fedortsov et al., BULK LIFETIME DETERMINATION IN HIGH-PURITY SILICON BY CONTACTLESS LASER TECHNIQUE, Journal of materials science. Materials in electronics, 8(3), 1997, pp. 213-216

Authors: VEDDE J GRAVESEN P
Citation: J. Vedde et P. Gravesen, THE FRACTURE STRENGTH OF NITROGEN-DOPED SILICON-WAFERS, Materials science & engineering. B, Solid-state materials for advanced technology, 36(1-3), 1996, pp. 246-250

Authors: PEDERSENBJERGAARD S SEMB SI VEDDE J BREVIK EM GREIBROKK T
Citation: S. Pedersenbjergaard et al., ENVIRONMENTAL SCREENING BY CAPILLARY GAS-CHROMATOGRAPHY COMBINED WITHMASS-SPECTROMETRY AND ATOMIC-EMISSION SPECTROSCOPY, Chemosphere, 32(6), 1996, pp. 1103-1115

Authors: PEDERSENBJERGAARD S SEMB SI VEDDE J BREVIK EM GREIBROKK T
Citation: S. Pedersenbjergaard et al., COMPARISON OF GC-ECD, GC-MS AND GC-AED FOR THE DETERMINATION OF POLYCHLORINATED-BIPHENYLS IN HIGHLY CONTAMINATED MARINE-SEDIMENTS, Chromatographia, 43(1-2), 1996, pp. 44-52

Authors: BENGTSSON S LJUNGBERG K VEDDE J
Citation: S. Bengtsson et al., THE INFLUENCE OF WAFER DIMENSIONS ON THE CONTACT WAVE VELOCITY IN SILICON-WAFER BONDING, Applied physics letters, 69(22), 1996, pp. 3381-3383

Authors: VISCOR P VEDDE J
Citation: P. Viscor et J. Vedde, ELECTRICAL-IMPEDANCE SPECTROSCOPY OF SILICON SURFACE-STATES, Surface science, 287, 1993, pp. 510-513

Authors: EKEBERG D HAGEN SI HVISTENDAHL G SCHULZE C UGGERUD E VEDDE J
Citation: D. Ekeberg et al., STRUCTURES AND THERMOCHEMISTRY OF IONS FORMED BY METHANE CHEMICAL-IONIZATION OF FE(CO)5 - SITE OF PROTONATION AND DETERMINATION OF FE-H ANDFE-CO BOND-DISSOCIATION ENERGIES OF HFE(CO)(N)+ IONS, Organic mass spectrometry, 28(12), 1993, pp. 1547-1554
Risultati: 1-7 |