Authors: DORMANS GJM LARSEN PK SPIERINGS GACM DIKKEN J ULENAERS MJE CUPPENS R TAYLOR DJ VERHAAR RDJ

Citation: Gjm. Dormans et al., PROCESSING AND PERFORMANCE OF INTEGRATED FERROELECTRIC AND CMOS TEST STRUCTURES FOR MEMORY APPLICATIONS, Integrated ferroelectrics, 6(1-4), 1995, pp. 93-109