Authors: VIRYASOVA TB GARNYK VS NAUMOV AV ISAIKIN VD RAUKHMAN MR KISELEVA NN

Citation: Tb. Viryasova et al., RELIABILITY OF RESULTS OBTAINED IN MEASURING THE MINORITY CHARGE-CARRIER LIFETIME IN SEMICONDUCTORS BY THE PEM EFFECT METHOD, Measurement techniques, 36(1), 1993, pp. 69-71