Authors:
GROCHOWSKI A
BHATTACHARYA D
VISWANATHAN TR
LAKER K
Citation: A. Grochowski et al., INTEGRATED-CIRCUIT TESTING FOR QUALITY ASSURANCE IN MANUFACTURING - HISTORY, CURRENT STATUS, AND FUTURE-TRENDS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 44(8), 1997, pp. 610-633
Citation: N. Sayiner et al., A LEVEL-CROSSING SAMPLING SCHEME FOR A D CONVERSION/, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 43(4), 1996, pp. 335-339