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Authors: GROCHOWSKI A BHATTACHARYA D VISWANATHAN TR LAKER K
Citation: A. Grochowski et al., INTEGRATED-CIRCUIT TESTING FOR QUALITY ASSURANCE IN MANUFACTURING - HISTORY, CURRENT STATUS, AND FUTURE-TRENDS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 44(8), 1997, pp. 610-633

Authors: SAYINER N SORENSEN HV VISWANATHAN TR
Citation: N. Sayiner et al., A LEVEL-CROSSING SAMPLING SCHEME FOR A D CONVERSION/, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 43(4), 1996, pp. 335-339
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