Authors:
Lahreche, H
Vaille, M
Vennegues, P
Laugt, M
Beaumont, B
Gibart, P
Citation: H. Lahreche et al., Microstructural analysis of III-V nitrides grown on 6H-SiC by metal-organic vapour phase epitaxy (MOVPE), DIAM RELAT, 9(3-6), 2000, pp. 452-455
Authors:
Vennegues, P
Beaumont, B
Bousquet, V
Vaille, M
Gibart, P
Citation: P. Vennegues et al., Reduction mechanisms for defect densities in GaN using one- or two-step epitaxial lateral overgrowth methods, J APPL PHYS, 87(9), 2000, pp. 4175-4181
Authors:
Nataf, G
Beaumont, B
Bouille, A
Vennegues, P
Haffouz, S
Vaille, M
Gibart, P
Citation: G. Nataf et al., High quality ELO-GaN layers on GaN/Al2O3 patterned substrates by halide vapour phase epitaxy, MAT SCI E B, 59(1-3), 1999, pp. 112-116
Authors:
Lahreche, H
Vennegues, P
Vaille, M
Beaumont, B
Laugt, M
Lorenzini, P
Gibart, P
Citation: H. Lahreche et al., Comparative study of GaN layers grown on insulating AlN and conductive AlGaN buffer layers, SEMIC SCI T, 14(11), 1999, pp. L33-L36
Authors:
Lahreche, H
Vaille, M
Beaumont, B
Laugt, M
Vennegues, P
Gibart, P
Citation: H. Lahreche et al., Metal organic vapour phase epitaxy (MOVPE) growth of GaN(n)/SiC(p) heterostructures, PHYS ST S-A, 176(1), 1999, pp. 109-112