AAAAAA
Results:
1-7
|
Results: 7
Authors:
Fazinic, S
Jaksic, M
Campbell, JL
Van Espen, P
Blaauw, M
Orlic, I
Citation: S. Fazinic et al., The 2000 IAEA test spectra for PIXE spectrometry, NUCL INST B, 183(3-4), 2001, pp. 439-448
Authors:
Osan, J
de Hoog, J
Van Espen, P
Szaloki, I
Ro, CU
Van Grieken, R
Citation: J. Osan et al., Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles, X-RAY SPECT, 30(6), 2001, pp. 419-426
Authors:
Van Vaeck, L
Van Espen, P
Gijbels, R
Baykut, G
Laukien, FH
Citation: L. Van Vaeck et al., A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source, EUR J MASS, 6(3), 2000, pp. 277-287
Authors:
Liu, XD
Van Espen, P
Adams, F
Cafmeyer, J
Maenhaut, W
Citation: Xd. Liu et al., Biomass burning in southern Africa: Individual particle characterization of atmospheric aerosols and savanna fire samples, J ATMOS CH, 36(2), 2000, pp. 135-155
Authors:
Cuynen, E
Goeminne, G
Van Espen, P
Terryn, H
Citation: E. Cuynen et al., Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis, SURF INT AN, 30(1), 2000, pp. 589-591
Authors:
Cuynen, E
Van Vaeck, L
Van Espen, P
Citation: E. Cuynen et al., Speciation analysis of oxides with static secondary ion mass spectrometry, RAP C MASS, 13(23), 1999, pp. 2287-2301
Authors:
Cuynen, E
Van Espen, P
Goeminne, G
Terryn, H
Citation: E. Cuynen et al., On the structure and chemical composition of chromium based conversion coatings on aluminium: a TOF SIMS study, J ANAL ATOM, 14(3), 1999, pp. 483-486
Risultati:
1-7
|