Authors:
Coeck, M
Balcaen, N
Van Hoecke, T
Van Waeyenberge, B
Segers, D
Dauwe, C
Laermans, C
Citation: M. Coeck et al., Defects in neutron transmutation doped silicon studied by positron annihilation lifetime measurements, J APPL PHYS, 87(8), 2000, pp. 3674-3677
Authors:
Slugen, V
Segers, D
de Bakker, PMA
De Grave, E
Magula, V
Van Hoecke, T
Van Waeyenberge, B
Citation: V. Slugen et al., Annealing behaviour of reactor pressure-vessel steels studied by positron-annihilation spectroscopy, Mossbauer spectroscopy and transmission electronmicroscopy, J NUCL MAT, 274(3), 1999, pp. 273-286