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Results:
1-8
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Results: 8
Authors:
Kalkman, AJ
Verbruggen, AH
Janssen, GCAM
Citation: Aj. Kalkman et al., Young's modulus measurements and grain boundary sliding in free-standing thin metal films, APPL PHYS L, 78(18), 2001, pp. 2673-2675
Authors:
van Veen, RG
Verbruggen, AH
van der Drift, E
Schaffler, F
Radelaar, S
Citation: Rg. Van Veen et al., Magnetoresistance fluctuations in short n-type Si/SiGe heterostructure wires, PHYS REV B, 61(11), 2000, pp. 7545-7552
Authors:
Lokker, JP
van der Pers, NM
Verbruggen, AH
Janssen, GCAM
Jongste, JF
Radelaar, S
Citation: Jp. Lokker et al., Localized stress near and the thermal expansion of Al2Cu precipitates in an Al thin film matrix, J APPL PHYS, 87(2), 2000, pp. 682-688
Authors:
Janssen, GCAM
Jongste, JF
Verbruggen, AH
Citation: Gcam. Janssen et al., Deformation mechanism in the forcefill process, J APPL PHYS, 87(2), 2000, pp. 889-892
Authors:
van Veen, RG
Verbruggen, AH
van der Drift, E
Schaffler, F
Radelaar, S
Citation: Rg. Van Veen et al., Experimental study on magnetoresistance phenomena in n-type Si SiGe quantum wires, SEMIC SCI T, 14(6), 1999, pp. 508-516
Authors:
van Veen, RG
Verbruggen, AH
van der Drift, E
Radelaar, S
Anders, S
Jaeger, HM
Citation: Rg. Van Veen et al., Micron-sized Hall probes on a Si/SiGe heterostructure as a tool to study vortex dynamics in high-temperature superconducting crystals, REV SCI INS, 70(3), 1999, pp. 1767-1770
Authors:
Kalkman, AJ
Verbruggen, AH
Janssen, GCAM
Groen, FH
Citation: Aj. Kalkman et al., A novel bulge-testing setup for rectangular free-standing thin films, REV SCI INS, 70(10), 1999, pp. 4026-4031
Authors:
Janssen, GCAM
Jongste, JF
Verbruggen, AH
Radelaar, S
Barth, HJ
Robl, W
Citation: Gcam. Janssen et al., The role of the TiN liner in forcefill, EL SOLID ST, 1(2), 1998, pp. 97-99
Risultati:
1-8
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