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Results:
1-7
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Results: 7
Authors:
Franquet, A
De Laet, J
Schram, T
Terryn, H
Subramanian, V
van Ooij, WJ
Vereecken, J
Citation: A. Franquet et al., Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry, THIN SOL FI, 384(1), 2001, pp. 37-45
Authors:
Valova, E
Armyanov, S
Franquet, A
Steenhaut, O
Hubin, A
Vereecken, J
Delplancke, JL
Citation: E. Valova et al., Incorporation of zinc in electroless deposited niclel-phosphorus alloys II. Compositional variations through alloy coating thickness, J ELCHEM SO, 148(4), 2001, pp. C274-C279
Authors:
Vandeputte, S
Hubin, A
Vereecken, J
Deslouis, C
Tribollet, B
Citation: S. Vandeputte et al., AC and electrohydrodynamic impedances for a chemical preceding electrochemical mechanism I. Theory, J ELCHEM SO, 147(8), 2000, pp. 3054-3065
Authors:
Schram, T
Franquet, A
Terryn, H
Vereecken, J
Citation: T. Schram et al., Spectroscopic ellipsometry: a non-destructive technique for surface analysis, ADV ENG MAT, 1(1), 1999, pp. 63-66
Authors:
Detroye, M
Reniers, F
Buess-Herman, C
Vereecken, J
Citation: M. Detroye et al., AES-XPS study of chromium carbides and chromium iron carbides, APPL SURF S, 145, 1999, pp. 78-82
Authors:
Gonnissen, D
Hubin, A
Vereecken, J
Citation: D. Gonnissen et al., EIS combined with SERS: a tool to study the adsorption of S2O32- and PMT in silver electroplating conditions, ELECTR ACT, 44(24), 1999, pp. 4129-4137
Authors:
Simons, W
Hubin, A
Vereecken, J
Citation: W. Simons et al., The role of electrochemical impedance spectroscopy (EIS) in the global characterisation of the reduction kinetics of hexacyanoferrate on anodised titanium, ELECTR ACT, 44(24), 1999, pp. 4373-4381
Risultati:
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