Citation: V. Baukens et al., Free-space optical interconnection modules for two-dimensional photonic very large scale integration circuitry based on microlenses and gradient-refractive-index lenses, OPT ENG, 40(11), 2001, pp. 2431-2441
Authors:
Verschaffelt, G
van der Vleuten, W
Creusen, M
Smalbrugge, E
van de Roer, TG
Karouta, F
Strijbos, RC
Danckaert, J
Veretennicoff, I
Ryvkin, B
Thienpont, H
Acket, GA
Citation: G. Verschaffelt et al., Polarization stabilization in vertical-cavity surface-emitting lasers through asymmetric current injection, IEEE PHOTON, 12(8), 2000, pp. 945-947
Authors:
Panajotov, K
Nagler, B
Verschaffelt, G
Georgievski, A
Thienpont, H
Danckaert, J
Veretennicoff, I
Citation: K. Panajotov et al., Impact of in-plane anisotropic strain on the polarization behavior of vertical-cavity surface-emitting lasers, APPL PHYS L, 77(11), 2000, pp. 1590-1592
Authors:
Baukens, V
Verschaffelt, G
Tuteleers, P
Vynck, P
Ottevaere, H
Kufner, M
Kufner, S
Veretennicoff, I
Bockstaele, R
Van Hove, A
Dhoedt, B
Baets, R
Thienpont, H
Citation: V. Baukens et al., Performances of optical multi-chip-module interconnects: comparing guided-wave and free-space pathways, J OPT A-P A, 1(2), 1999, pp. 255-261
Authors:
Erneux, T
Danckaert, J
Panajotov, K
Veretennicoff, I
Citation: T. Erneux et al., Two-variable reduction of the San Miguel-Feng-Moloney model for vertical-cavity surface-emitting lasers, PHYS REV A, 59(6), 1999, pp. 4660-4667
Authors:
Panajotov, K
Berghmans, F
Peeters, M
Verschaffelt, G
Danckaert, J
Veretennicoff, I
Thienpont, H
Citation: K. Panajotov et al., Data transparent reconfigurable optical interconnections using polarization switching in VCSEL's induced by optical injection, IEEE PHOTON, 11(8), 1999, pp. 985-987
Authors:
Ryvkin, B
Panajotov, K
Georgievski, A
Danckaert, J
Peeters, M
Verschaffelt, G
Thienpont, H
Veretennicoff, I
Citation: B. Ryvkin et al., Effect of photon-energy-dependent loss and gain mechanisms on polarizationswitching in vertical-cavity surface-emitting lasers, J OPT SOC B, 16(11), 1999, pp. 2106-2113