Authors: Viard, J Durand, J Beche, E Berjoan, R Ducarroir, M Nadal, M

Citation: J. Viard et al., Characterization of PECVD films of SiOxNy : H, VIDE, 54(294), 1999, pp. 503-512

Authors: Viard, J

Citation: J. Viard, Pierre Leroux incognito and Bergsonianism, PENSEE, (320), 1999, pp. 113-128