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Results: 1
Effects of trapped charges on Hg-Schottky capacitance-voltage measurementsof n-type epitaxial silicon wafers
Authors:
Wang, Q Liu, D Virgo, JT Yeh, J Hillard, RJ
Citation:
Q. Wang et al., Effects of trapped charges on Hg-Schottky capacitance-voltage measurementsof n-type epitaxial silicon wafers, J VAC SCI A, 18(4), 2000, pp. 1308-1312
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