Authors:
Brunet-Bruneau, A
Fisson, S
Gallas, B
Vuye, G
Rivory, J
Citation: A. Brunet-bruneau et al., Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity, THIN SOL FI, 377, 2000, pp. 57-61
Authors:
Gallas, B
Fisson, S
Brunet-Bruneau, A
Vuye, G
Rivory, J
Citation: B. Gallas et al., Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors, THIN SOL FI, 377, 2000, pp. 62-67
Authors:
Leprince-Wang, Y
Souche, D
Yu-Zhang, K
Fisson, S
Vuye, G
Rivory, J
Citation: Y. Leprince-wang et al., Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition, THIN SOL FI, 359(2), 2000, pp. 171-176
Authors:
Brunet-Bruneau, A
Fisson, S
Vuye, G
Rivory, J
Citation: A. Brunet-bruneau et al., Change of TO and LO mode frequency of evaporated SiO2 films during aging in air, J APPL PHYS, 87(10), 2000, pp. 7303-7309