Authors: GRAF D LAMBERT U BROHL M EHLERT A WAHLICH R WAGNER P

Citation: D. Graf et al., COMPARISON OF HIGH-TEMPERATURE ANNEALED CZOCHRALSKI SILICON-WAFERS AND EPITAXIAL WAFERS, Materials science & engineering. B, Solid-state materials for advanced technology, 36(1-3), 1996, pp. 50-54

Authors: GRAF D LAMBERT U BROHL M EHLERT A WAHLICH R WAGNER P

Citation: D. Graf et al., IMPROVEMENT OF CZOCHRALSKI SILICON-WAFERS BY HIGH-TEMPERATURE ANNEALING, Journal of the Electrochemical Society, 142(9), 1995, pp. 3189-3192