AAAAAA

   
Results: 1-3 |
Results: 3
ATOMIC-FORCE MICROSCOPY - A KEY TO DIRECT WAFER BENDING TECHNOLOGY
Authors: WATT VHC MOINPOUR M BOWER R SUNDARARAMAN R
Citation: Vhc. Watt et al., ATOMIC-FORCE MICROSCOPY - A KEY TO DIRECT WAFER BENDING TECHNOLOGY, Journal of materials science letters, 14(2), 1995, pp. 96-98
IMPLEMENTATION OF AN ACTIVE-R FILTER BUILDING-BLOCK IN SEMICUSTOM VLSI
Authors: SODERSTRAND MA WATT VHC GEE KB MCGINTY D
Citation: Ma. Soderstrand et al., IMPLEMENTATION OF AN ACTIVE-R FILTER BUILDING-BLOCK IN SEMICUSTOM VLSI, International journal of electronics, 76(3), 1994, pp. 469-482
LOW-TEMPERATURE DIRECT BONDING OF NON-HYDROPHILIC SURFACES
Authors: WATT VHC BOWER RW
Citation: Vhc. Watt et Rw. Bower, LOW-TEMPERATURE DIRECT BONDING OF NON-HYDROPHILIC SURFACES, Electronics Letters, 30(9), 1994, pp. 693-695
Risultati: 1-3 |