Authors: SCHMITTTHOMAS KG WEGE S SCHWEIGART H

Citation: Kg. Schmittthomas et al., ELECTROMIGRATION - A TYPICAL CORROSION PH ENOMENON IN MICROELECTRONICS, Werkstoffe und Korrosion, 46(6), 1995, pp. 366-369

Authors: BAUTSCH M VARADINEK P WEGE S NIEDRIG H

Citation: M. Bautsch et al., COMPACT AND INEXPENSIVE QUARTZ CAPILLARITRON SOURCE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 591-593

Authors: WEGE S BAUTSCH M RUBESAME D NIEDRIG H WITTICH T

Citation: S. Wege et al., SIMULATION OF ION SPUTTERING OF ROTATING AMORPHOUS OR POLYCRYSTALLINESOLIDS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 94-97

Authors: WEGE S

Citation: S. Wege, FAILURE MECHANISM UNDER CORROSION ON SURFACE MOUNTED DEVICES, Werkstoffe und Korrosion, 44(4), 1993, pp. 137-141