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A COMPREHENSIVE STUDY OF HOT-CARRIER INSTABILITY IN P-TYPE AND N-TYPEPOLY-SI GATED MOSFETS
Authors:
HSU CCH WEN DS WORDEMAN MR TAUR Y NING TH
Citation:
Cch. Hsu et al., A COMPREHENSIVE STUDY OF HOT-CARRIER INSTABILITY IN P-TYPE AND N-TYPEPOLY-SI GATED MOSFETS, I.E.E.E. transactions on electron devices, 41(5), 1994, pp. 675-680
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