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Results:
1-2
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Results: 2
Authors:
THEISS W
WERNKE M
OFFERMANN V
Citation: W. Theiss et al., DEPTH PROFILING OF POROUS SILICON LAYERS BY ATTENUATED TOTAL-REFLECTION SPECTROSCOPY, Thin solid films, 255(1-2), 1995, pp. 181-184
Authors:
BERGER MG
DIEKER C
THONISSEN M
VESCAN L
LUTH H
MUNDER H
THEISS W
WERNKE M
GROSSE P
Citation: Mg. Berger et al., POROSITY SUPERLATTICES - A NEW CLASS OF SI HETEROSTRUCTURES, Journal of physics. D, Applied physics, 27(6), 1994, pp. 1333-1336
Risultati:
1-2
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