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Authors: WIEDMANN U GALLION P DUAN GH
Citation: U. Wiedmann et al., A GENERALIZED-APPROACH TO OPTICAL LOW-COHERENCE REFLECTOMETRY INCLUDING SPECTRAL FILTERING EFFECTS, Journal of lightwave technology, 16(7), 1998, pp. 1343-1347

Authors: WIEDMANN U GALLION P JAOUEN Y CHABRAN C
Citation: U. Wiedmann et al., ANALYSIS OF DISTRIBUTED-FEEDBACK LASERS USING OPTICAL LOW-COHERENCE REFLECTOMETRY, Journal of lightwave technology, 16(5), 1998, pp. 864-869

Authors: WIEDMANN U GALLION P
Citation: U. Wiedmann et P. Gallion, LEAKAGE CURRENT MEASUREMENT IN MULTIELECTRODE LASERS USING OPTICAL LOW-COHERENCE REFLECTOMETRY, IEEE photonics technology letters, 9(8), 1997, pp. 1134-1136

Authors: WIEDMANN U
Citation: U. Wiedmann, FIRING TECHNOLOGY FOR LOW EMISSION CHIP DRYING - THE BISON KORTING CA-SYSTEM, Holz als Roh- und Werkstoff, 49(11), 1991, pp. 433-438
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