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Results: 1-9 |
Results: 9
INVESTIGATION OF THE SYNTHESIS AND INTERNAL STRUCTURE OF PROTECTIVE OXIDE LAYERS ON HIGH-PURITY CHROMIUM WITH SIMS SCANNING TECHNIQUES
Authors: BRUNNER C HUTTER H PIPLITS K WILHARTITZ P STROOSNIJDER R GRASSERBAUER M
Citation: C. Brunner et al., INVESTIGATION OF THE SYNTHESIS AND INTERNAL STRUCTURE OF PROTECTIVE OXIDE LAYERS ON HIGH-PURITY CHROMIUM WITH SIMS SCANNING TECHNIQUES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 233-236
HIGH-PERFORMANCE ULTRA-TRACE ANALYSIS IN MOLYBDENUM AND TUNGSTEN ACCOMPLISHED BY ONLINE COUPLING OF ION CHROMATOGRAPHY WITH SIMULTANEOUS ICP-AES
Authors: WILHARTITZ P DREER S KRISMER R BOBLETER O
Citation: P. Wilhartitz et al., HIGH-PERFORMANCE ULTRA-TRACE ANALYSIS IN MOLYBDENUM AND TUNGSTEN ACCOMPLISHED BY ONLINE COUPLING OF ION CHROMATOGRAPHY WITH SIMULTANEOUS ICP-AES, Mikrochimica acta, 125(1-4), 1997, pp. 45-52
INVESTIGATION OF THE FORMATION AND PROPERTIES OF PROTECTIVE OXIDE LAYERS ON HIGH-PURITY CHROMIUM WITH SIMS IMAGING TECHNIQUES
Authors: BRUNNER C HUTTER H WILHARTITZ P GRASSERBAUER M
Citation: C. Brunner et al., INVESTIGATION OF THE FORMATION AND PROPERTIES OF PROTECTIVE OXIDE LAYERS ON HIGH-PURITY CHROMIUM WITH SIMS IMAGING TECHNIQUES, Mikrochimica acta, 125(1-4), 1997, pp. 69-72
3-DIMENSIONAL CHARACTERIZATION OF TRACE-ELEMENT DISTRIBUTION IN HIGH-PURITY CHROMIUM
Authors: HUTTER H BRUNNER C WILHARTITZ P GRASSERBAUER M
Citation: H. Hutter et al., 3-DIMENSIONAL CHARACTERIZATION OF TRACE-ELEMENT DISTRIBUTION IN HIGH-PURITY CHROMIUM, Mikrochimica acta, 122(3-4), 1996, pp. 195-202
3D-SIMS ANALYSIS OF ULTRA-HIGH PURITY MOLYBDENUM AND TUNGSTEN - A CHARACTERIZATION OF DIFFERENT MANUFACTURING TECHNIQUES AND PRODUCTS
Authors: WILHARTITZ P KRISMER R HUTTER H GRASSERBAUER M WEINBRUCH S ORTNER HM
Citation: P. Wilhartitz et al., 3D-SIMS ANALYSIS OF ULTRA-HIGH PURITY MOLYBDENUM AND TUNGSTEN - A CHARACTERIZATION OF DIFFERENT MANUFACTURING TECHNIQUES AND PRODUCTS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 524-532
OPTIMIZATION OF PLASMA TECHNIQUES FOR TRACE ANALYSIS OF REFRACTORY-METALS
Authors: WILHARTITZ P
Citation: P. Wilhartitz, OPTIMIZATION OF PLASMA TECHNIQUES FOR TRACE ANALYSIS OF REFRACTORY-METALS, Mikrochimica acta, 120(1-4), 1995, pp. 53-61
CLASSIFICATION OF SECONDARY-ION MASS-SPECTROMETRY (SIMS) MICROGRAPHS TO CHARACTERIZE CHEMICAL-PHASES
Authors: LATKOCZY C HUTTER H GRASSERBAUER M WILHARTITZ P
Citation: C. Latkoczy et al., CLASSIFICATION OF SECONDARY-ION MASS-SPECTROMETRY (SIMS) MICROGRAPHS TO CHARACTERIZE CHEMICAL-PHASES, Mikrochimica acta, 119(1-2), 1995, pp. 1-12
ONLINE COUPLING OF ION CHROMATOGRAPHY AND ATOMIC SPECTROMETRY AND USEOF DIRECT GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY AS NEW TOOLS FOR ULTRA-TRACE DETERMINATIONS IN REFRACTORY-METALS
Authors: SEUBERT A WILHARTITZ P KRISMER R KRABICHLER H
Citation: A. Seubert et al., ONLINE COUPLING OF ION CHROMATOGRAPHY AND ATOMIC SPECTROMETRY AND USEOF DIRECT GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY AS NEW TOOLS FOR ULTRA-TRACE DETERMINATIONS IN REFRACTORY-METALS, Mikrochimica acta, 117(3-4), 1995, pp. 245-260
TOPOCHEMICAL CHARACTERIZATION OF MATERIALS USING 3D-SIMS
Authors: HUTTER H WILHARTITZ P GRASSERBAUER M
Citation: H. Hutter et al., TOPOCHEMICAL CHARACTERIZATION OF MATERIALS USING 3D-SIMS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 66-68
Risultati: 1-9 |