CLASSIFICATION OF SECONDARY-ION MASS-SPECTROMETRY (SIMS) MICROGRAPHS TO CHARACTERIZE CHEMICAL-PHASES

This work demonstrates the potential of multivariate image analysis me thods in the extraction of useful, problem dependent information from SIMS images. Specific algorithms have been developed to classify SIMS micrographs manually as well as automatically. A feature selection has been achieved by means of principal component analysis with a subsequ ent image classification. As an application example for these improved digital image processing tools chemical phases within a soldered indu strial metal sample have been identified. This is of highly practical value as it was assumed that during the soldering process inhomogeneit ies occur along the joint site which cause a cracking of the brazed ma terial under mechanical strain conditions.