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Results: 1-25/986
Authors:
STATHAM PJ
Citation: Pj. Statham, RECENT DEVELOPMENTS IN INSTRUMENTATION FOR X-RAY-MICROANALYSIS, Mikrochimica acta (1966), 1998, pp. 1-9
Authors:
LOVE G
NICHOLSON WAP
ARMIGLIATO A
Citation: G. Love et al., MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS - PREFACE, Mikrochimica acta (1966), 1998, pp. 5-5
Authors:
STRUDER L
FIORINI C
GATTI E
HARTMANN R
HOLL P
KRAUSE N
LECHNER P
LONGONI A
LUTZ G
KEMMER J
MEIDINGER N
POPP M
SOLTAU H
VONZANTHIER C
Citation: L. Struder et al., HIGH-RESOLUTION NON DISPERSIVE-X-RAY SPECTROSCOPY WITH STATE-OF-THE-ART SILICON DETECTORS, Mikrochimica acta (1966), 1998, pp. 11-19
Authors:
ROHRBACHER K
ANDRAE M
VOLKERER M
WERNISCH J
Citation: K. Rohrbacher et al., EFFICIENCY CALIBRATION OF A SI(LI) DETECTOR BY EPMA, Mikrochimica acta (1966), 1998, pp. 21-28
Authors:
REED SJB
Citation: Sjb. Reed, WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRY, Mikrochimica acta (1966), 1998, pp. 29-36
Authors:
TITCHMARSH JM
Citation: Jm. Titchmarsh, X-RAY-SPECTRUM PROCESSING AND MULTIVARIATE-ANALYSIS, Mikrochimica acta (1966), 1998, pp. 37-47
Authors:
WILLIAMS DB
WATANABE M
CARPENTER DT
Citation: Db. Williams et al., THIN-FILM ANALYSIS AND CHEMICAL MAPPING IN THE ANALYTICAL ELECTRON-MICROSCOPE, Mikrochimica acta (1966), 1998, pp. 49-57
Authors:
ARMIGLIATO A
HOWARD DJ
BALBONI R
FRABBONI S
CAYMAX MR
Citation: A. Armigliato et al., ON THE SPATIAL-RESOLUTION IN ANALYTICAL ELECTRON-MICROSCOPY, Mikrochimica acta (1966), 1998, pp. 59-64
Authors:
LABAR JL
ADAMIK M
DODONY I
Citation: Jl. Labar et al., CONTAMINATION IN ANALYTICAL ELECTRON-MICROSCOPY AND IN ALCHEMI, Mikrochimica acta (1966), 1998, pp. 65-71
Authors:
ZIEBA P
Citation: P. Zieba, ANALYTICAL ELECTRON-MICROSCOPY OF DIFFUSIONAL INTERFACES IN AN AL-22AT-PERCENT-ZN ALLOY, Mikrochimica acta (1966), 1998, pp. 73-76
Authors:
DRAZIC G
MALIC B
KOSEC M
Citation: G. Drazic et al., QUANTITATIVE TEM-EDXS OF SOL-GEL DERIVED PZT CERAMIC MATERIALS, Mikrochimica acta (1966), 1998, pp. 77-82
Authors:
FARYNA M
LITYNSKA L
HABERKO K
PEDZICH Z
BABIARZ J
Citation: M. Faryna et al., PARTICULATE COMPOSITES OF TZP CHROMIUM-OXIDE AND TZP CHROMIUM CARBIDE- MICROBEAM INVESTIGATIONS, Mikrochimica acta (1966), 1998, pp. 83-86
Authors:
OLESHKO VP
GIJBELS RH
JACOB WA
VANDAELE AJ
Citation: Vp. Oleshko et al., CRYOELECTRON SPECTROSCOPIC IMAGING, ELECTRON-ENERGY-LOSS SPECTROSCOPYAND ENERGY-DISPERSIVE X-RAY-ANALYSIS OF AG(BR,I) NANOCRYSTALS AND MICROCRYSTALS, Mikrochimica acta (1966), 1998, pp. 87-92
Authors:
LEVIN I
BERNER A
SCHEU C
MUELLEJANS H
BRANDON DG
Citation: I. Levin et al., ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE OF ALUMINA POLYMORPHS, Mikrochimica acta (1966), 1998, pp. 93-96
Authors:
FAN YC
FITZGERALD AG
XU HC
Citation: Yc. Fan et al., SPM STUDY OF YBCO FILMS PREPARED BY PLASMA-ASSISTED LASER-ABLATION, Mikrochimica acta (1966), 1998, pp. 97-100
Authors:
FITZGERALD AG
FAN YC
XU HC
Citation: Ag. Fitzgerald et al., SURFACE CHARACTERIZATION AND MODIFICATION OF YBCO THIN-FILMS BY STM, Mikrochimica acta (1966), 1998, pp. 101-107
Authors:
KARDUCK P
Citation: P. Karduck, QUANTITATIVE NEAR-SURFACE MICROANALYSIS AND DEPTH PROFILING BY EPMA, Mikrochimica acta (1966), 1998, pp. 109-123
Authors:
RICHTER S
LESCH N
KARDUCK P
Citation: S. Richter et al., EPMA SPUTTER DEPTH PROFILING, PART-I - THEORY AND EVALUATION, Mikrochimica acta (1966), 1998, pp. 125-131
Authors:
LESCH N
RICHTER S
KARDUCK P
Citation: N. Lesch et al., EPMA SPUTTER DEPTH PROFILING, PART-II - EXPERIMENT, Mikrochimica acta (1966), 1998, pp. 133-139
Authors:
WILLICH P
WISCHMANN U
Citation: P. Willich et U. Wischmann, QUANTITATIVE-ANALYSIS OF BN (C,O,AR,H)-COATINGS USING EPMA AND SIMS, Mikrochimica acta (1966), 1998, pp. 141-147
Authors:
RICKERBY DG
WACHTER N
REICHELT R
Citation: Dg. Rickerby et al., QUANTITATIVE EDS ANALYSIS OF SIO2 AL2O3/TIO2 MULTILAYER FILMS/, Mikrochimica acta (1966), 1998, pp. 149-154
Authors:
LLOVET X
MERLET C
SALVAT FF
Citation: X. Llovet et al., SURFACE-IONIZATION OF THIN-FILMS ON SUBSTRATES - MEASUREMENT AND SIMULATION, Mikrochimica acta (1966), 1998, pp. 155-161
Authors:
ESSER HG
KARDUCK P
RUBEL M
ALMQVIST N
GROBUSCH L
VONSEGGERN J
WESCHENFELDER F
WIENHOLD P
Citation: Hg. Esser et al., COMPARISON OF DIFFERENT METHODS TO CHARACTERIZE THIN A-SI-H FILMS, Mikrochimica acta (1966), 1998, pp. 163-170
Authors:
HAMMER H
KULOW S
SCHMIDT C
SCHMIDT G
ZANEL P
Citation: H. Hammer et al., EPMA STUDIES OF THE GROWTH OF THIN SURFACE-COATINGS PRODUCED BY EVAPORATION, Mikrochimica acta (1966), 1998, pp. 171-176
Authors:
OHLIDAL I
FRANTA D
HORA J
NAVRATIL K
WEBER J
JANDA P
Citation: I. Ohlidal et al., ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Mikrochimica acta (1966), 1998, pp. 177-180