Authors:
PEASE RL
SHANEYFELT M
WINOKUR P
FLEETWOOD D
GORELICK J
MCCLURE S
CLARK S
COHN L
ALEXANDER D
Citation: Rl. Pease et al., MECHANISMS FOR TOTAL-DOSE SENSITIVITY TO PREIRRADIATION THERMAL-STRESS IN BIPOLAR LINEAR MICROCIRCUITS, IEEE transactions on nuclear science, 45(3), 1998, pp. 1425-1430