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Results:
1-10
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Results: 10
Authors:
MUMMLER K
WISSMANN P
Citation: K. Mummler et P. Wissmann, ELLIPSOMETRICAL STUDIES ON THE AU SI(111) SYSTEM/, Thin solid films, 317(1-2), 1998, pp. 193-197
Authors:
MUMMLER K
WISSMANN P
Citation: K. Mummler et P. Wissmann, SPECTROSCOPIC ELLIPSOMETRY ON GOLD CLUSTERS EMBEDDED IN A SI(111) SURFACE, Thin solid films, 313, 1998, pp. 522-526
Authors:
BRUGGEMANN M
MUMMLER K
WISSMANN P
Citation: M. Bruggemann et al., ELECTRICAL AND OPTICAL-PROPERTIES OF MELTING AU SI EUTECTICS ON SI(111)/, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 179-181
Authors:
FINZEL HU
BI HP
WISSMANN P
Citation: Hu. Finzel et al., THE KINETICS OF CATALYTIC REACTIONS STUDIED BY RESISTIVITY MEASUREMENTS ON THIN METAL-FILMS, Zeitschrift fur Naturforschung. A, A journal of physical sciences, 52(8-9), 1997, pp. 640-644
Authors:
RAUH M
HEPING B
WISSMANN P
Citation: M. Rauh et al., THE EFFECT OF CO ADSORPTION ON THE RESISTIVITY OF THIN PD FILMS, Applied physics A: Materials science & processing, 61(6), 1995, pp. 587-590
Authors:
RAUH M
WISSMANN P
Citation: M. Rauh et P. Wissmann, OPTICAL AND ELECTRICAL MEASUREMENTS ON CO2 COVERED COPPER-FILMS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 769-771
Authors:
HLOCH H
WISSMANN P
Citation: H. Hloch et P. Wissmann, THE ELECTRICAL-RESISTIVITY OF THIN PD FILMS GROWN ON SI(111), Physica status solidi. a, Applied research, 145(2), 1994, pp. 521-526
Authors:
WOLFEL M
RAUH M
WISSMANN P
Citation: M. Wolfel et al., SPECTROSCOPIC ELLIPSOMETRY ON XENON MONOLAYERS ADSORBED ON GOLD-FILMS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 362-364
Authors:
RAUH M
WISSMANN P
WOLFEL M
Citation: M. Rauh et al., ELLIPSOMETRIC STUDIES ON THE OXIDATION OF THIN COPPER-FILMS, Thin solid films, 233(1-2), 1993, pp. 289-292
Authors:
RAUH M
WISSMANN P
Citation: M. Rauh et P. Wissmann, THE OXIDATION-KINETICS OF THIN COPPER-FILMS STUDIED BY ELLIPSOMETRY, Thin solid films, 228(1-2), 1993, pp. 121-124
Risultati:
1-10
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