Authors: SCHULTZ JA ULRICH S WOOLVERTON L BURTON W WATERS K KLEIN C WOLLNIK H

Citation: Ja. Schultz et al., FAST POSITION-SENSITIVE DETECTION APPLIED TO TIME-OF-FLIGHT ION-SCATTERING AND RECOIL SPECTROSCOPY FOR REALTIME MONITORING OF SURFACE-COMPOSITION AND CRYSTALLOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 758-765