Citation: Cj. Fiedler et al., Separation of thermal wave induced displacements and thermoreflectance variations using a rotated beamsplitter cube interferometer, REV SCI INS, 71(10), 2000, pp. 3853-3859
Citation: Cjk. Richardson et al., Measurements of nanometer scale interface diffusion between tungsten and niobium thin films using high frequency laser based ultrasound, J ACOUST SO, 107(4), 2000, pp. 1987-1993
Citation: Cjk. Richardson et al., Interferometric detection of ultrafast thermoelastic transients in thin films: theory with supporting experiment, J OPT SOC B, 16(6), 1999, pp. 1007-1015