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Results:
1-9
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Results: 9
Authors:
Walther, HG
Fournier, D
Krapez, JC
Luukkala, M
Schmitz, B
Sibilia, C
Stamm, H
Thoen, J
Citation: Hg. Walther et al., Photothermal steel hardness measurements - Results and perspectives, ANAL SCI, 17, 2001, pp. S165-S168
Authors:
Chirtoc, M
Gibkes, J
Walther, HG
Christ, A
Antoniow, JS
Bicanic, D
Bozoki, Z
Szabo, G
Bein, B
Pelzl, J
Kleebauer, M
Bader, H
Marinelli, M
Citation: M. Chirtoc et al., Comparative study of coating thickness determination in packaging composite materials using photothermal radiometry, photoacoustic and photopyroelectric methods, ANAL SCI, 17, 2001, pp. S185-S188
Authors:
Walther, HG
Aleshin, V
Citation: Hg. Walther et V. Aleshin, Depth profiling based on laterally resolved photothermal measurements, ANAL SCI, 17, 2001, pp. S402-S405
Authors:
Walther, HG
Larciprete, MC
Mayr, P
Paoloni, S
Schmitz, B
Citation: Hg. Walther et al., Frequency selective radiometric characterization of steel, ANAL SCI, 17, 2001, pp. S428-S431
Authors:
Walther, HG
Christ, A
Citation: Hg. Walther et A. Christ, Photoacoustic study of layer thickness and moisture content from varnishedpackaging materials, J APPL PHYS, 89(7), 2001, pp. 4124-4127
Authors:
Walther, HG
Citation: Hg. Walther, Photothermal inspection of rough steel surfaces, J APPL PHYS, 89(5), 2001, pp. 2939-2942
Authors:
Ostrovskii, IV
Korotchenkov, OA
Burbelo, RM
Walther, HG
Citation: Iv. Ostrovskii et al., Characterization of semiconductor heterostructures by acousto-optical perturbation technique, MAT SCI E B, 76(2), 2000, pp. 139-144
Authors:
Walther, HG
Aleshin, V
Citation: Hg. Walther et V. Aleshin, Inspection of inhomogeneous samples by combined laterally scanned and frequency resolved photothermal measurements, J APPL PHYS, 86(11), 1999, pp. 6512-6518
Authors:
Walther, HG
Kitzing, T
Bozoki, Z
Liakhou, GL
Paoloni, S
Citation: Hg. Walther et al., Probing thermal conductivity variations in excimer laser irradiated polyimide foils, J APPL PHYS, 85(11), 1999, pp. 7540-7543
Risultati:
1-9
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