Authors:
Yokoi, H
Mizumoto, T
Shimizu, M
Waniishi, T
Futakuchi, N
Kaida, N
Nakano, Y
Citation: H. Yokoi et al., Analysis of GaInAsP surfaces by contact-angle measurement for wafer directbonding with garnet crystals, JPN J A P 1, 38(8), 1999, pp. 4780-4783