Authors:
Warwick, T
Cambie, D
Padmore, HA
Howells, MR
Citation: T. Warwick et al., A variable-included-angle plane-grating-monochromator on an undulator for spectroscopy and microscopy at the Advanced Light Source, NUCL INST A, 467, 2001, pp. 525-528
Citation: S. Seal et al., A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system, J MAT SCI L, 19(2), 2000, pp. 123-126
Authors:
Graupner, R
Ye, Q
Warwick, T
Bourret-Courchesne, E
Citation: R. Graupner et al., Study of interface reactions between Si and GaN at high temperatures usingscanning photoelectron microscopy and X-ray absorption spectroscopy, J CRYST GR, 217(1-2), 2000, pp. 55-64
Authors:
Tonner, BP
Droubay, T
Denlinger, J
Meyer-Ilse, W
Warwick, T
Rothe, J
Kneedler, E
Pecher, K
Nealson, K
Grundl, T
Citation: Bp. Tonner et al., Soft X-ray spectroscopy and imaging of interfacial chemistry in environmental specimens, SURF INT AN, 27(4), 1999, pp. 247-258