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Results: 1-10 |
Results: 10
Nondestructive methodology for standoff height measurement of flip chip onflex (FCOF) by SAM
Authors: Tang, CW Chan, YC Hung, KC Webb, DP
Citation: Cw. Tang et al., Nondestructive methodology for standoff height measurement of flip chip onflex (FCOF) by SAM, IEEE T AD P, 24(2), 2001, pp. 163-168
Study of self-alignment of mu BGA packages
Authors: Hung, KC Chan, YC Tu, PL Ong, HC Webb, DP Lai, JKL
Citation: Kc. Hung et al., Study of self-alignment of mu BGA packages, IEEE T AD P, 23(4), 2000, pp. 631-636
Nondestructive evaluation of ceramic substrate with embedded passive components by SAM
Authors: Yu, ZQ Chan, YC Webb, DP Li, GY
Citation: Zq. Yu et al., Nondestructive evaluation of ceramic substrate with embedded passive components by SAM, J ELEC PACK, 122(2), 2000, pp. 172-177
Gap states and stability of rapidly deposited hydrogenated amorphous silicon films
Authors: Lin, SH Chan, YC Webb, DP Lam, YW
Citation: Sh. Lin et al., Gap states and stability of rapidly deposited hydrogenated amorphous silicon films, MAT SCI E B, 72(2-3), 2000, pp. 197-199
Photoinduced dehydrogenation of defects in undoped a-Si : H using positronannihilation spectroscopy
Authors: Zou, X Chan, YC Webb, DP Lam, YW Hu, YF Beling, CD Fung, S Weng, HM
Citation: X. Zou et al., Photoinduced dehydrogenation of defects in undoped a-Si : H using positronannihilation spectroscopy, PHYS REV L, 84(4), 2000, pp. 769-772
Reliability in modeling of spectroscopic ellipsometry
Authors: Lin, SH Chan, YC Webb, DP Lam, YW Lam, A
Citation: Sh. Lin et al., Reliability in modeling of spectroscopic ellipsometry, PHYS ST S-A, 182(2), 2000, pp. R1-R2
Investigation of mis-estimation of structure of amorphous silicon films inellipsometric modeling
Authors: Lin, SH Chan, YC Webb, DP Lam, YW
Citation: Sh. Lin et al., Investigation of mis-estimation of structure of amorphous silicon films inellipsometric modeling, J NON-CRYST, 276(1-3), 2000, pp. 35-39
Bandwidth considerations in modulated and transient photoconductivity measurements to determine localized state distributions
Authors: Reynolds, S Main, C Webb, DP Grabtchak, S
Citation: S. Reynolds et al., Bandwidth considerations in modulated and transient photoconductivity measurements to determine localized state distributions, J APPL PHYS, 88(1), 2000, pp. 278-282
Carrier transport in thin films of organic electroluminescent materials
Authors: Deng, ZB Lee, ST Webb, DP Chan, YC Gambling, WA
Citation: Zb. Deng et al., Carrier transport in thin films of organic electroluminescent materials, SYNTH METAL, 107(2), 1999, pp. 107-109
Optical characterization of hydrogenated amorphous silicon thin films deposited at high rate
Authors: Lin, SH Chan, YC Webb, DP Lam, YW
Citation: Sh. Lin et al., Optical characterization of hydrogenated amorphous silicon thin films deposited at high rate, J ELEC MAT, 28(12), 1999, pp. 1452-1456
Risultati: 1-10 |