Authors: Weirich, TE

Citation: Te. Weirich, Electron crystallography without limits? Crystal structure of Ti45Se16 redetermined by electron diffraction structure analysis, ACT CRYST A, 57, 2001, pp. 183-191

Authors: Oksuzoglu, RM Elmali, A Weirich, TE Fuess, H Hahn, H

Citation: Rm. Oksuzoglu et al., Evolution of the surface roughness (dynamic scaling) and microstructure ofsputter-deposited Ag75Co25 granular films, J PHYS-COND, 12(44), 2000, pp. 9237-9245

Authors: Weirich, TE Winterer, M Seifried, S Hahn, H Fuess, H

Citation: Te. Weirich et al., Rietveld analysis of electron powder diffraction data from nanocrystallineanatase, TiO2, ULTRAMICROS, 81(3-4), 2000, pp. 263-270

Authors: Weirich, TE Zou, XD Ramlau, R Simon, A Cascarano, GL Giacovazzo, C Hovmoller, S

Citation: Te. Weirich et al., Structures of nanometre-size crystals determined from selected-area electron diffraction data, ACT CRYST A, 56, 2000, pp. 29-35

Authors: Weirich, TE Hovmoller, S Kalpen, H Ramlau, R Simon, A

Citation: Te. Weirich et al., Electron diffraction versus X-ray diffraction - a comparative study of theTa2P structure, CRYSTALLO R, 43(6), 1998, pp. 956-967