Authors:
Wiame, F
Rujirawat, S
Brill, G
Xin, Y
Caudano, R
Sivananthan, S
Browning, ND
Sporken, R
Citation: F. Wiame et al., Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy, SURF SCI, 454, 2000, pp. 818-822