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ENG
Results:
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Results: 1
Laser beam backside probing of CMOS integrated circuits
Authors:
Kasapi, S Tsao, CC Wilsher, K Lo, W Somani, S
Citation:
S. Kasapi et al., Laser beam backside probing of CMOS integrated circuits, MICROEL REL, 39(6-7), 1999, pp. 957-961
Risultati:
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