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Citation: Jib. Wilson et al., Analysis of chemical vapour deposited diamond films by X-ray photoelectronspectroscopy, J ELEC SPEC, 121(1-3), 2001, pp. 183-201

Authors: Fan, Y Fitzgerald, AG Cairns, JA John, P Troupe, CE Wilson, JIB

Citation: Y. Fan et al., A novel STM-based depth profiling technique for the electronic characterisation of thin film materials, APPL SURF S, 162, 2000, pp. 630-637

Authors: Fitzgerald, AG Fan, YC John, P Troupe, CE Wilson, JIB Tooke, AO Storey, BE

Citation: Ag. Fitzgerald et al., Study of the interface microstructures of CVD diamond films by TEM, MIKROCH ACT, 132(2-4), 2000, pp. 315-321

Authors: Fan, YC Fitzgerald, AG John, P Troupe, CE Wilson, JIB

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Authors: Bonnar, MP Burnside, BM Christie, J Sceal, EJ Troupe, CE Wilson, JIB

Citation: Mp. Bonnar et al., Hydrophobic coatings from plasma polymerized vinyltrimethylsilane, CHEM VAPOR, 5(3), 1999, pp. 117-125

Authors: Bonnar, MP Wilson, JIB Burnside, BM Reuben, RL Gengenbach, TR Griesser, HJ Beamson, G

Citation: Mp. Bonnar et al., X-ray photoelectron spectroscopic investigation of the durability of siloxane plasma polymer coatings in a steam atmosphere, J MATER SCI, 33(19), 1998, pp. 4843-4855