Authors:
Wolter, SD
Schlesser, R
Okuzumi, F
Prater, JT
Sitar, Z
Citation: Sd. Wolter et al., Angle-dependent reflectometry as a technique for fast assessment of highlyoriented diamond film quality, DIAM RELAT, 10(11), 2001, pp. 2092-2095
Authors:
Wolter, SD
Okuzumi, F
Prater, JT
Sitar, Z
Citation: Sd. Wolter et al., Frequency and duty cycle dependence on the pulsed bias-enhanced nucleationof highly oriented diamond on (100) silicon, PHYS ST S-A, 186(2), 2001, pp. 331-337
Citation: Sd. Wolter et al., Raman spectroscopic characterization of diamond films grown in a low-pressure flat flame, J CRYST GR, 226(1), 2001, pp. 88-94