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Ahmed, K
De, I
Osburn, C
Wortman, J
Hauser, J
Citation: K. Ahmed et al., Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's, IEEE DEVICE, 47(4), 2000, pp. 891-895
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Huang, W
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Schilkey, F
Schwertfeger, J
Siepel, A
Stamper, D
Thayer, N
Thompson, R
Wortman, J
Zhuang, JJ
Harger, C
Citation: Mp. Skupski et al., The genome sequence database: towards an integrated functional genomics resource, NUCL ACID R, 27(1), 1999, pp. 35-38