Authors: Kunst, M Abdallah, O Wunsch, F

Citation: M. Kunst et al., The characterization of silicon nitride films by contactless transient photoconductivity measurements, THIN SOL FI, 383(1-2), 2001, pp. 61-64

Authors: Kunst, M Wunsch, F von Aichberger, S

Citation: M. Kunst et al., Recombination at high charge carrier concentrations in a-Si : H films, THIN SOL FI, 383(1-2), 2001, pp. 274-276