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Results: 1-7 |
Results: 7
Extreme ultraviolet (EUV) sources for lithography based on synchrotron radiation
Authors: Dattoli, G Doria, A Gallerano, GP Giannessi, L Hesch, K Moser, HO Ottaviani, PL Pellegrin, E Rossmanith, R Steininger, R Saile, V Wust, J
Citation: G. Dattoli et al., Extreme ultraviolet (EUV) sources for lithography based on synchrotron radiation, NUCL INST A, 474(3), 2001, pp. 259-272
Modeling development effort in object-oriented systems using design properties
Authors: Briand, LC Wust, J
Citation: Lc. Briand et J. Wust, Modeling development effort in object-oriented systems using design properties, IEEE SOFT E, 27(11), 2001, pp. 963-986
The stability of ferroelectric polarization of PVDF upon irradiation
Authors: Giegerich, U Wust, J Jungnickel, BJ
Citation: U. Giegerich et al., The stability of ferroelectric polarization of PVDF upon irradiation, IEEE DIELEC, 7(3), 2000, pp. 353-359
Exploring the relationships between design measures and software quality in object-oriented systems
Authors: Briand, LC Wust, J Daly, JW Porter, DV
Citation: Lc. Briand et al., Exploring the relationships between design measures and software quality in object-oriented systems, J SYST SOFT, 51(3), 2000, pp. 245-273
Infection of a hip prosthesis by Actinomyces naeslundii
Authors: Wust, J Steiger, U Vuong, H Zbinden, R
Citation: J. Wust et al., Infection of a hip prosthesis by Actinomyces naeslundii, J CLIN MICR, 38(2), 2000, pp. 929-930
The impact of design properties on development cost in object-oriented systems
Authors: Briand, LC Wust, J
Citation: Lc. Briand et J. Wust, The impact of design properties on development cost in object-oriented systems, SEVENTH INTERNATIONAL SOFTWARE METRICS SYMPOSIUM - METRICS 2001, PROCEEDINGS, 2000, pp. 260-271
Technology transfer in the Research Centre Karlsruhe
Authors: Wust, J Oberdorfer, I
Citation: J. Wust et I. Oberdorfer, Technology transfer in the Research Centre Karlsruhe, ATW-INT Z K, 44(6), 1999, pp. 353
Risultati: 1-7 |