Authors:
Defives, D
Durand, O
Wyczisk, F
Noblanc, O
Brylinski, C
Meyer, F
Citation: D. Defives et al., Electrical behaviour and microstructural analysis of metal Schottky contacts on 4H-SiC, MICROEL ENG, 55(1-4), 2001, pp. 369-374
Authors:
Huet, F
Di Forte-Poisson, MA
Calligaro, M
Olivier, J
Wyczisk, F
Di Persio, J
Citation: F. Huet et al., The behavior of Ni/Au contacts under rapid thermal annealing in GaN devicestructures, J ELEC MAT, 28(12), 1999, pp. 1440-1443