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Results: 1-14 |
Results: 14
PROCESS-CONTROL AND STATISTICAL INFERENCE. (VOL 29, PG 134, 1997)
Authors: CROWDER SV HAWKINS DM REYNOLDS MR YASHCHIN E
Citation: Sv. Crowder et al., PROCESS-CONTROL AND STATISTICAL INFERENCE. (VOL 29, PG 134, 1997), Journal of quality technology, 30(4), 1998, pp. 423-423
SURVIVAL WITH COMPETING RISKS AND MASKED CAUSES OF FAILURES
Authors: FLEHINGER BJ REISER B YASHCHIN E
Citation: Bj. Flehinger et al., SURVIVAL WITH COMPETING RISKS AND MASKED CAUSES OF FAILURES, Biometrika, 85(1), 1998, pp. 151-164
MAGNETIC-PROPERTIES OF SINTERED AND DEFORMED AG BISCCO TAPES/
Authors: GOLDGIRSH A BEILIN V YASHCHIN E FELNER I SCHIEBER M
Citation: A. Goldgirsh et al., MAGNETIC-PROPERTIES OF SINTERED AND DEFORMED AG BISCCO TAPES/, Physica. C, Superconductivity, 282, 1997, pp. 2213-2214
CHANGE-POINT MODELS IN INDUSTRIAL APPLICATIONS
Authors: YASHCHIN E
Citation: E. Yashchin, CHANGE-POINT MODELS IN INDUSTRIAL APPLICATIONS, Nonlinear analysis, 30(7), 1997, pp. 3997-4006
STATISTICAL-INFERENCE FOR MASKED DATA
Authors: REISER B YASHCHIN E FLEHINGER BJ
Citation: B. Reiser et al., STATISTICAL-INFERENCE FOR MASKED DATA, Nonlinear analysis, 30(7), 1997, pp. 4425-4432
PROCESS-CONTROL AND STATISTICAL-INFERENCE
Authors: CROWDER SV HAWKINS DM REYNOLDS MR YASHCHIN E
Citation: Sv. Crowder et al., PROCESS-CONTROL AND STATISTICAL-INFERENCE, Journal of quality technology, 29(2), 1997, pp. 134-139
INFERENCE ABOUT DEFECTS IN THE PRESENCE OF MASKING
Authors: FLEHINGER BJ REISER B YASHCHIN E
Citation: Bj. Flehinger et al., INFERENCE ABOUT DEFECTS IN THE PRESENCE OF MASKING, Technometrics, 38(3), 1996, pp. 247-255
LIKELIHOOD RATIO METHODS FOR MONITORING PARAMETERS OF A NESTED RANDOMEFFECT MODEL
Authors: YASHCHIN E
Citation: E. Yashchin, LIKELIHOOD RATIO METHODS FOR MONITORING PARAMETERS OF A NESTED RANDOMEFFECT MODEL, Journal of the American Statistical Association, 90(430), 1995, pp. 729-738
ESTIMATING THE CURRENT MEAN OF A PROCESS SUBJECT TO ABRUPT CHANGES
Authors: YASHCHIN E
Citation: E. Yashchin, ESTIMATING THE CURRENT MEAN OF A PROCESS SUBJECT TO ABRUPT CHANGES, Technometrics, 37(3), 1995, pp. 311-323
UNTITLED - COMMENT
Authors: YASHCHIN E
Citation: E. Yashchin, UNTITLED - COMMENT, Technometrics, 37(2), 1995, pp. 243-243
FERROELECTRIC PHASE-TRANSITION TEMPERATURES OF KTIOPO4, CRYSTALS GROWN FROM SELF-FLUXES
Authors: ANGERT N TSEITLIN M YASHCHIN E ROTH M
Citation: N. Angert et al., FERROELECTRIC PHASE-TRANSITION TEMPERATURES OF KTIOPO4, CRYSTALS GROWN FROM SELF-FLUXES, Applied physics letters, 67(13), 1995, pp. 1941-1943
MONITORING VARIANCE-COMPONENTS
Authors: YASHCHIN E
Citation: E. Yashchin, MONITORING VARIANCE-COMPONENTS, Technometrics, 36(4), 1994, pp. 379-393
GROWTH AND DOMAIN-STRUCTURE OF POTASSIUM TITANYL PHOSPHATE CRYSTALS PULLED FROM HIGH-TEMPERATURE SOLUTIONS
Authors: ANGERT N KAPLUN L TSEITLIN M YASHCHIN E ROTH M
Citation: N. Angert et al., GROWTH AND DOMAIN-STRUCTURE OF POTASSIUM TITANYL PHOSPHATE CRYSTALS PULLED FROM HIGH-TEMPERATURE SOLUTIONS, Journal of crystal growth, 137(1-2), 1994, pp. 116-122
STATISTICAL CONTROL SCHEMES - METHODS, APPLICATIONS AND GENERALIZATIONS
Authors: YASHCHIN E
Citation: E. Yashchin, STATISTICAL CONTROL SCHEMES - METHODS, APPLICATIONS AND GENERALIZATIONS, International statistical review, 61(1), 1993, pp. 41-66
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